Modular Solutions for Flexible Reliability Testing
Understand the evolving needs of reliability testing and the distinct advantage of modular systems from Accel-RF
Engineering with Reliability in Mind
Learn how to accelerate time-to-market with reliability data and a company-wide culture of quality
Types of Semiconductor Reliability and Quality Testing
Explore the different types of tests needed for quality assurance
Accel-RF: The World Leader in Compound Semiconductor Reliability Testing
Maximum ROI through reduced product development time, demonstrated reliability, and increased “permission-to-play” market opportunities.
Accel-RF designs and manufactures fully integrated, scalable turnkey test systems.
- Provides dynamic, multi-dimensional, RF, DC, and temperature tests
- All in one platform with a powerful graphical user interface
- Designed for a small footprint and at significantly less cost than competing solutions
Our extensive technical and industry knowledge allows us to surpass the level of customer support provided by others in the field of RF-biased and high-voltage accelerated life testing.
About Accel-RF
Effects of Aging on the Intermodulation Distortion Levels of GaN HEMT Devices
Accel-RF Instruments Corporation has developed a novel test method for investigating aging effects on 3rd order intermodulation distortion (IMD3) levels.
As more recently developed compound semiconductor technologies , such as GaN, are utilized in new applications due to their enhanced capabilities, the need for more application-specific performance degradation testing grows.
Learn how we’re blazing trails towards a more reliable future for GaN in our new report!
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